無監督學習用於不良品偵測

MUSTIR > College of Engineering > Department and Institute of Electronic Engineering > Research Projects in School > Item 987654321/1402

Please use this identifier to cite or link to this item: http://120.105.36.38/ir/handle/987654321/1402

Title:	無監督學習用於不良品偵測
Authors:	莊正
Contributors:	電子系
Keywords:	無監督學習用不良品偵測、產線 AI 化
Date:	2020-10
Issue Date:	2020-11-30 09:37:43 (UTC+8)
Abstract:	本計劃為製造業產線 AI 化中之關鍵技術,使用無監督深度學習來偵測偶發及不規則不良品, 以提高良率及節省人力成本.包括軟體系統整合,影像處理與人工智慧辨識.
Appears in Collections:	[Department and Institute of Electronic Engineering] Research Projects in School

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